Please use this identifier to cite or link to this item: http://dspace.utpl.edu.ec/handle/123456789/19317
Full metadata record
DC FieldValueLanguage
dc.contributor.authorStashans, A.es_ES
dc.contributor.authorRivera Escobar, R.es_ES
dc.contributor.authorOlivos, K.es_ES
dc.date.accessioned2017-06-16T22:03:20Z-
dc.date.available2011-05-26es_ES
dc.date.available2017-06-16T22:03:20Z-
dc.date.issued2011-06-01es_ES
dc.date.submitted11/01/2011es_ES
dc.identifier10.1088/0031-8949/83/06/065604es_ES
dc.identifier.isbn318949es_ES
dc.identifier.other10.1088/0031-8949/83/06/065604es_ES
dc.identifier.urihttp://dspace.utpl.edu.ec/handle/123456789/19317-
dc.description.abstractFirst-principles calculations based on density functional theory and strengthened by Hartree-Fock computations have been performed to study a Ga-doped wurtzite-type ZnO crystal. The large 108-atom supercell used throughout this work allows one to model a single point defect within the periodic supercell model. Thus, the Ga impurity produced purely local effects on the properties of the material. The electronic band structure was obtained for both pure and impurity-doped materials. The occurrence of free electrons in the conduction band was observed after the incorporation of Ga, implying the Ga dopant s contribution to n-type electrical conductivity in the ZnO crystal, in agreement with known experimental data. An analysis of the charges on atoms and obtained atomic displacements in the region surrounding the defect showed that there is some alteration in the chemical bonding because of the presence of Ga atoms. In particular, the ionic bonding is strengthened in the defect s neighbourhood. © 2011 The Royal Swedish Academy of Sciences.es_ES
dc.languageIngléses_ES
dc.subjectznoes_ES
dc.subjectgaes_ES
dc.subjectdopinges_ES
dc.subjectdft+ues_ES
dc.titlePhysical and chemical properties of a Ga-doped ZnO crystales_ES
dc.typeArticlees_ES
dc.publisherPhysica Scriptaes_ES
Appears in Collections:Artículos de revistas Científicas



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.